DocumentCode :
1827979
Title :
Segmentation-free measurement of cortical thickness from MRI
Author :
Aganj, Iman ; Sapiro, Guillermo ; Parikshak, Neelroop ; Madsen, Sarah K. ; Thompson, Paul M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN
fYear :
2008
fDate :
14-17 May 2008
Firstpage :
1625
Lastpage :
1628
Abstract :
Estimating the thickness of cerebral cortex is a key step in many MR brain imaging studies, revealing valuable information on development or disease progression. In this work we present a new approach to measure the cortical thickness, based on minimizing line integrals over the probability map of the gray matter in the MRI volume. Previous methods often perform a binary-valued segmentation of the gray matter before measuring the thickness. Because of image noise and partial voluming, such a hard classification ignores the underlying tissue class probabilities assigned to each voxel, discarding potentially useful information. We describe our proposed method and demonstrate its performance on both artificial volumes and real 3D brain MRI data from subjects with Alzheimer´s disease and healthy individuals.
Keywords :
biomedical MRI; biomedical measurement; brain; diseases; medical image processing; probability; thickness measurement; Alzheimer´s disease; MRI volume; artificial volumes; cerebral cortex thickness estimation; disease progression; gray matter; healthy individuals; line integrals; probability map; real 3D MRI brain imaging; segmentation-free measurement; Alzheimer´s disease; Biomedical imaging; Cerebral cortex; Electric variables measurement; Image segmentation; Laboratories; Magnetic resonance imaging; Neuroimaging; Thickness measurement; Volume measurement; Cortical thickness measurement; gray matter density; magnetic resonance imaging; soft classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
Type :
conf
DOI :
10.1109/ISBI.2008.4541324
Filename :
4541324
Link To Document :
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