• DocumentCode
    1828044
  • Title

    Customized jig ForTest debug

  • Author

    Feng, Phang Siow ; Sun, Wong Kok

  • Author_Institution
    Stats Chippac Ltd., Singapore, Singapore
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    435
  • Lastpage
    438
  • Abstract
    For new product development process, companies must constantly look for ways to optimize processes for time and cost saving. Test Engineers today are facing major challenges as products require quick time to market. This affects test development schedules where Test Engineers are pushed with tighter project timelines. The major time constraint is usually the waiting time for device sockets and DUT boards to be delivered, which usually take several weeks, before debug can commence. One of the ways to overcome this constraint is to fabricate a customized fixture which is able to hold the DUT. This jig should allow for easy connection to instrument resources of the test system. In this paper, the concept of a customized fixture with plug-in pin connectors will be discussed.
  • Keywords
    fixtures; integrated circuit testing; DUT board; customized fixture; customized jig; device socket; plug-in pin connector; product development; project timelines; test debug; test development schedule; time constraint; Arrays; Debugging; Fabrication; Flip chip; Hardware; Sockets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184460
  • Filename
    6184460