DocumentCode
1828044
Title
Customized jig ForTest debug
Author
Feng, Phang Siow ; Sun, Wong Kok
Author_Institution
Stats Chippac Ltd., Singapore, Singapore
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
435
Lastpage
438
Abstract
For new product development process, companies must constantly look for ways to optimize processes for time and cost saving. Test Engineers today are facing major challenges as products require quick time to market. This affects test development schedules where Test Engineers are pushed with tighter project timelines. The major time constraint is usually the waiting time for device sockets and DUT boards to be delivered, which usually take several weeks, before debug can commence. One of the ways to overcome this constraint is to fabricate a customized fixture which is able to hold the DUT. This jig should allow for easy connection to instrument resources of the test system. In this paper, the concept of a customized fixture with plug-in pin connectors will be discussed.
Keywords
fixtures; integrated circuit testing; DUT board; customized fixture; customized jig; device socket; plug-in pin connector; product development; project timelines; test debug; test development schedule; time constraint; Arrays; Debugging; Fabrication; Flip chip; Hardware; Sockets;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location
Singapore
Print_ISBN
978-1-4577-1983-7
Electronic_ISBN
978-1-4577-1981-3
Type
conf
DOI
10.1109/EPTC.2011.6184460
Filename
6184460
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