DocumentCode :
1828044
Title :
Customized jig ForTest debug
Author :
Feng, Phang Siow ; Sun, Wong Kok
Author_Institution :
Stats Chippac Ltd., Singapore, Singapore
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
435
Lastpage :
438
Abstract :
For new product development process, companies must constantly look for ways to optimize processes for time and cost saving. Test Engineers today are facing major challenges as products require quick time to market. This affects test development schedules where Test Engineers are pushed with tighter project timelines. The major time constraint is usually the waiting time for device sockets and DUT boards to be delivered, which usually take several weeks, before debug can commence. One of the ways to overcome this constraint is to fabricate a customized fixture which is able to hold the DUT. This jig should allow for easy connection to instrument resources of the test system. In this paper, the concept of a customized fixture with plug-in pin connectors will be discussed.
Keywords :
fixtures; integrated circuit testing; DUT board; customized fixture; customized jig; device socket; plug-in pin connector; product development; project timelines; test debug; test development schedule; time constraint; Arrays; Debugging; Fabrication; Flip chip; Hardware; Sockets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
Type :
conf
DOI :
10.1109/EPTC.2011.6184460
Filename :
6184460
Link To Document :
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