Title :
Cortical correspondence using entropy-based particle systems and local features
Author :
Oguz, Ipek ; Cates, Joshua ; Fletcher, Thomas ; Whitaker, Ross ; Cool, Derek ; Aylward, Stephen ; Styner, Martin
Author_Institution :
Depts. of Comput. Sci., Univ. of North Carolina, Chapel Hill, NC
Abstract :
This paper presents a new method of constructing compact statistical point-based models of populations of human cortical surfaces with functions of spatial locations driving the correspondence optimization. The proposed method is to establish a tradeoff between an even sampling of the surfaces (a low surface entropy) and the similarity of corresponding points across the population (a low ensemble entropy). The similarity metric, however, isn´t constrained to be just spatial proximity, but can be any function of spatial location, thus allowing the integration of local cortical geometry as well as DTI connectivity maps and vasculature information from MRA images. This method does not require a spherical parameterization or fine tuning of parameters. Experimental results are also presented, showing lower local variability for both sulcal depth and cortical thickness measurements, compared to other commonly used methods such as FreeSurfer.
Keywords :
biomedical MRI; biomedical measurement; blood vessels; brain; entropy; image sampling; medical image processing; optimisation; physiological models; statistical analysis; DTI connectivity maps; MRA images; cortical thickness measurement; ensemble entropy; entropy-based particle systems; human cortical surfaces; local cortical geometry; local variability; optimization; spatial proximity; statistical point-based models; sulcal depth; surface entropy; vasculature information; Biomedical computing; Biomedical imaging; Computer science; Cost function; Diffusion tensor imaging; Entropy; Humans; Mesh generation; Optimization methods; Shape; Brain Modeling; Correspondence; Image Registration; Image Shape Analysis; Statistics;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
DOI :
10.1109/ISBI.2008.4541327