Title :
Tools and techniques for converting simulation models into test patterns
Author_Institution :
LTX/Trillium, San Jose, CA, USA
Abstract :
This paper focuses on the problems of extraction of the timing and functional data from the simulation of a complex digital device and the creation of a test pattern suitable for execution on a digital test system. The specific areas of interest are the structure of the device model, representation of the timing information, and language for defining waveforms
Keywords :
circuit CAD; integrated circuit design; integrated circuit modelling; integrated circuit testing; object-oriented methods; waveform analysis; chip model; digital test system; functional data; object oriented method; pattern vectors; reverse translation; simulation models; test patterns; timing data; timing information; waveform representation; Automatic testing; Circuit testing; Hardware; Integrated circuit testing; Object oriented modeling; Signal processing; Software systems; Software testing; System testing; Timing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470709
