• DocumentCode
    1828154
  • Title

    Application of statistical techniques to critical system parameters

  • Author

    Boyle, Rick ; Donovan, Jack ; Hnatek, Eugene ; Ijaz, Alex

  • Author_Institution
    Tandem Comput. Inc., Cupertino, CA, USA
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    108
  • Lastpage
    114
  • Abstract
    An IC supplier´s specification or data sheet electrical parameter limits are meaningless without knowledge of the supplier´s process capability (i.e., a given critical electrical parameter´s centering and distribution), especially if one is attempting to select the most robust supplier. This paper provides practical examples of how statistical techniques can be used to facilitate selection of suppliers who are most capable of delivering product with minimal variation and for monitoring the ongoing performance of a supplier
  • Keywords
    integrated circuit testing; production testing; quality control; statistical analysis; ASIC; PAL; SRAM; centering; critical system parameters; data sheet electrical parameter limits; distribution; specification; statistical techniques; supplier capability; Application software; Application specific integrated circuits; Distributed computing; Gaussian distribution; Integrated circuit testing; Lifting equipment; Monitoring; Packaging; Robustness; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470712
  • Filename
    470712