DocumentCode :
1828154
Title :
Application of statistical techniques to critical system parameters
Author :
Boyle, Rick ; Donovan, Jack ; Hnatek, Eugene ; Ijaz, Alex
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
fYear :
1993
fDate :
17-21 Oct 1993
Firstpage :
108
Lastpage :
114
Abstract :
An IC supplier´s specification or data sheet electrical parameter limits are meaningless without knowledge of the supplier´s process capability (i.e., a given critical electrical parameter´s centering and distribution), especially if one is attempting to select the most robust supplier. This paper provides practical examples of how statistical techniques can be used to facilitate selection of suppliers who are most capable of delivering product with minimal variation and for monitoring the ongoing performance of a supplier
Keywords :
integrated circuit testing; production testing; quality control; statistical analysis; ASIC; PAL; SRAM; centering; critical system parameters; data sheet electrical parameter limits; distribution; specification; statistical techniques; supplier capability; Application software; Application specific integrated circuits; Distributed computing; Gaussian distribution; Integrated circuit testing; Lifting equipment; Monitoring; Packaging; Robustness; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
Type :
conf
DOI :
10.1109/TEST.1993.470712
Filename :
470712
Link To Document :
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