Title :
A new CdZnTe-based gamma camera for high resolution pinhole SPECT
Author :
Funk, Tobias ; Parnham, Kevin B. ; Patt, Bradley E. ; Li, Joshua ; Iwanczyk, Jan S. ; Iwata, Koji ; Hwang, Andrew B. ; Hasegawa, Bruce H.
Author_Institution :
Dept. of Radiol., California Univ., San Francisco, CA, USA
Abstract :
We have developed and tested a pixelated detector for pinhole SPECT. The 80×80 detector has a pixel size of 2.5×2.5 mm2 and incorporates the room-temperature solid-state semiconductor CdZnTe which offers direct charge conversion and good stopping power for radionuclides used for small animal SPECT. To optimize low energy photon detection, the detector is operated at a temperature of 15±1°C, and has been designed to minimize absorption losses for photons entering the active detector material. The CdZnTe detector demonstrates good uniformity, spatial resolution and energy resolution. Transmission images obtained with an 125I point source demonstrate its low-energy performance, while dual isotope images were obtained using 99mTc and 201Tl. The detector therefore offers good performance for high-resolution small animal SPECT.
Keywords :
gamma-ray detection; iodine; position sensitive particle detectors; radioisotopes; semiconductor counters; single photon emission computed tomography; 2.5 mm; 125I; 125I point source; 201Tl; 99Tcm; CdZnTe-based gamma camera; Tc; absorption losses; active detector material; direct charge conversion; dual isotope images; energy resolution; high-resolution small animal SPECT; low energy photon detection; low-energy performance; pinhole SPECT; pixel size; pixelated detector; radionuclides; room-temperature solid-state semiconductor CdZnTe detector; spatial resolution; stopping power; transmission images; Animals; Cameras; Design optimization; Detectors; Electromagnetic wave absorption; Semiconductor materials; Single photon emission computed tomography; Solid state circuits; Temperature; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
Print_ISBN :
0-7803-8257-9
DOI :
10.1109/NSSMIC.2003.1352361