Title :
NIR Light Penetration Depth in the Rat Peripheral Nerve and Brain Cortex
Author :
Abdo, A. ; Sahin, M.
Author_Institution :
New Jersey Inst. of Technol., Hoboken
Abstract :
Near infrared (NIR) light energy has been used in medical applications both for diagnostic and treatment purposes. A priory knowledge of optical tissue properties is necessary in these applications; not only of human but also in animals for testing of devices. However, published data on the optical properties of neural tissue in rodents are rare. The aim of this study was to measure the penetration depth of light into the rat peripheral nerve and brain cortex at NIR wavelengths. Penetration depth was calculated from measurements of transmitted light for various thicknesses of the neural tissue. We found the penetration depth in the rat sciatic nerve to be 0.35plusmn0.023 mm and in the white matter 0.35plusmn0.026 mm. The penetration depth of the gray matter was 0.41plusmn0.029 mm. Compared to the data reported in literature for the human brain, the rat peripheral and the brain cortex attenuate the NIR light much more strongly.
Keywords :
bio-optics; biological tissues; biomedical optical imaging; brain; light transmission; patient diagnosis; patient treatment; brain cortex; light reflection; light transmission; medical diagnosis; medical treatment; near infrared light energy; near infrared light penetration depth; neural tissue; rat peripheral nerve; rat sciatic nerve; tissue optical properties; white matter; Animals; Biomedical equipment; Biomedical optical imaging; Humans; Medical services; Medical treatment; Optical attenuators; Optical devices; Testing; Wavelength measurement; near infrared light; penetration depth; reflectance; transmittance; Animals; Brain; Brain Mapping; Cerebral Cortex; Equipment Design; Infrared Rays; Light; Neurons; Peripheral Nervous System; Rats; Rats, Sprague-Dawley; Sciatic Nerve; Spectroscopy, Near-Infrared;
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
Print_ISBN :
978-1-4244-0787-3
DOI :
10.1109/IEMBS.2007.4352642