DocumentCode
1828980
Title
An Original Apparatus for Endurance Testing of MEMS Electrical Contact Materials
Author
Vincent, Maxime ; Chiesi, Laurent ; Rousset, Patrick ; Lapiere, Christophe ; Poulain, Christophe ; Carbone, Laurent ; Houzé, Frédéric ; Delamare, Jérôme
fYear
2009
fDate
14-16 Sept. 2009
Firstpage
288
Lastpage
292
Keywords
Contact resistance; Degradation; Gold; Life testing; Magnetic materials; Materials testing; Micromechanical devices; Microswitches; Organic materials; Scanning probe microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location
Vancouver, British Columbia, Canada
Print_ISBN
978-1-4244-3613-2
Electronic_ISBN
978-1-4244-3613-2
Type
conf
DOI
10.1109/HOLM.2009.5284386
Filename
5284386
Link To Document