DocumentCode :
1829031
Title :
New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements
Author :
Root, David E. ; Wood, John ; Tufillaro, Nick
Author_Institution :
Agilent Technol., Santa Rosa, CA, USA
fYear :
2003
fDate :
2-6 June 2003
Firstpage :
85
Lastpage :
90
Abstract :
This paper compares and contrasts recent nonlinear behavioral modeling techniques designed for microwave and RFIC application which arise in radio and communication systems, and in the design of broad-band nonlinear components used for microwave instrumentation. These techniques include dynamic neural networks and nonlinear time series models in the time-domain, nonlinear describing functions in the frequency domain, and envelope-based methods in mixed time and frequency domains. Approaches to generating these models from both simulation and nonlinear microwave measurements are reviewed.
Keywords :
frequency-domain analysis; integrated circuit measurement; integrated circuit modelling; microwave integrated circuits; microwave measurement; mobile radio; radiofrequency integrated circuits; time-domain analysis; RF IC; dynamic neural networks; envelope-based methods; microwave IC; microwave instrumentation; nonlinear behavioral modeling; nonlinear microwave measurements; nonlinear time series models; simulation; Circuit simulation; Frequency domain analysis; Integrated circuit modeling; Microwave measurements; Microwave technology; Microwave theory and techniques; Permission; Radio frequency; Radiofrequency integrated circuits; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
Type :
conf
DOI :
10.1109/DAC.2003.1218821
Filename :
1218821
Link To Document :
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