• DocumentCode
    1829057
  • Title

    Experimental Validation of a 2-D Constriction Resistance Model at the Microscale

  • Author

    Bilhaut, Lise ; Poulain, Christophe ; Anciant, Romain ; Duraffourg, Laurent

  • fYear
    2009
  • fDate
    14-16 Sept. 2009
  • Firstpage
    293
  • Lastpage
    297
  • Keywords
    Apertures; Conductivity; Contact resistance; Electric resistance; Electrical resistance measurement; Electrons; Immune system; Micromechanical devices; Power system reliability; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
  • Conference_Location
    Vancouver, British Columbia, Canada
  • Print_ISBN
    978-1-4244-3613-2
  • Electronic_ISBN
    978-1-4244-3613-2
  • Type

    conf

  • DOI
    10.1109/HOLM.2009.5284387
  • Filename
    5284387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1829057