• DocumentCode
    1829173
  • Title

    Effective nesting of Layer Manufacturing fabricated parts using a Genetic Algorithm and a bottom-left ray casting procedure

  • Author

    Canellidis, V. ; Giannatsis, J. ; Dedoussis, V.

  • Author_Institution
    Dept. of Ind. Manage. & Technol., Univ. of Piraeus, Piraeus, Greece
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    547
  • Lastpage
    551
  • Abstract
    Two aspects have been identified to be the key elements to the effective utilization of Layer Manufacturing (LM) technologies, that is maximization of the build volume and part orientation. The present work examines the utilization of a Genetic Algorithm in conjunction with effective placement rules as a mean of optimizing the build volume of LM technologies. The optimization is achieved via the dense nesting of parts, to be fabricated, on the LM machine platform. The software tool developed tackles the 2D nesting problem associated with the parts projections on the machine platform. The effectiveness and reliability of the proposed methodology is demonstrated via a case study concerning representative “real-world” parts/objects with quite general free form geometry.
  • Keywords
    computational geometry; genetic algorithms; layered manufacturing; production engineering computing; ray tracing; software packages; 2D nesting problem; LM machine platform; LM technology; bottom-left ray casting; fabricated part; free form geometry; genetic algorithm; layer manufacturing; optimization; parts projection; placement rule; software tool; Biological cells; Fabrication; Gallium; Optimization; Shape; Three dimensional displays; Genetic Algorithm; Layer Manufacturing; nesting problem; ray casting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674508
  • Filename
    5674508