Title :
Behavioural modeling of microwave oscillating amplifiers
Author :
Calandra, Enrico F. ; Ruggirello, R.
Author_Institution :
Dipt. di Ingegneria Elettrica, Palermo Univ., Italy
Abstract :
The problem of deriving, from experimental data, a behavioral nonlinear model capable of predicting the dynamical response of microwave oscillating amplifiers (either continuous-wave or pulsed) is addressed. Experimental results are reported, showing that a good simulation accuracy can be combined with an excellent computational efficiency by resorting to a black-box modeling approach in the stroboscopic time domain, in which the oscillating amplifier is described by an algebraic-differential set of fundamental frequency phasor equations that can be considered as a "three-port" extended Van der Pol (3P-E-VdP) model of the embedded synchronized oscillator. An additional advantage of the proposed behavioral approach over standard, detailed, equivalent circuit modeling techniques is the small number of unknown model parameters that have to be identified and the fact that their values can be rather straightforwardly extracted from experimental data obtained from conventional microwave measuring apparatus
Keywords :
circuit analysis computing; injection locked amplifiers; microwave amplifiers; microwave integrated circuits; 3P-E-VdP; Van der Pol model; algebraic-differential set; behavioral nonlinear model; behavioural modeling; black-box modeling approach; dynamical response; embedded synchronized oscillator; equivalent circuit modeling techniques; fundamental-frequency phasor equations; injection-locked amplifiers; microwave measuring apparatus; microwave oscillating amplifiers; stroboscopic time-domain; Computational efficiency; Computational modeling; Equations; Equivalent circuits; Frequency synchronization; Measurement standards; Microwave amplifiers; Microwave oscillators; Predictive models; Pulse amplifiers;
Conference_Titel :
Behavioral Modeling and Simulation, 2001. BMAS 2001. Proceedings of the Fifth IEEE International Workshop on
Conference_Location :
Santa Rosa, CA
Print_ISBN :
0-7803-7291-3
DOI :
10.1109/BMAS.2001.962491