Random walks in a supply network

Author

Qian, Haifeng ; Nassif, Sani R. ; Sapatnekar, Sachin S.

Author_Institution

Univ. of Minnesota, Minneapolis, MN, USA

fYear

2003

fDate

2-6 June 2003

Firstpage

93

Lastpage

98

Abstract

This paper presents a power grid analyzer based on a random walk technique. A linear-time algorithm is first demonstrated for DC analysis, and is then extended to perform transient analysis. The method has the desirable property of localizing computation, so that it shows massive benefits over conventional methods when only a small part of the grid is to be analyzed (for example, when the effects of small changes to the grid are to be examined). Even for the full analysis of the grid, experimental results show tat the method is faster than existing approaches and has an acceptable error margin. This method has been applied to test circuits of up to 2.3M nodes. For example, for a circuit with 70K nodes, the solution time for a single node was 0.42 sec and the complete solution was obtained in 17.6 sec.

Keywords

RC circuits; circuit analysis computing; digital circuits; integrated circuit design; transient analysers; transient analysis; 0.42 sec; 17.6 sec; DC analysis; circuit testing; linear-time algorithm; localizing computation; power grid analyzer; random walk; supply network; transient analysis; Algorithm design and analysis; Capacitors; Circuit testing; Integrated circuit reliability; Intelligent networks; Mesh generation; Performance analysis; Power grids; Transient analysis; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2003. Proceedings

Print_ISBN

1-58113-688-9

Type

conf

DOI

10.1109/DAC.2003.1218831

Filename

1218831