Title :
Performance analysis of monolithic RF transformers by experimental characterization
Author :
Kamgaing, T. ; Myers, T. ; Feng Ling ; Petras, M. ; Miller, M. ; Ramahi, O.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Abstract :
Electrical performances of 4-port n:n dual-spiral transformers fabricated in a thick plated copper on silicon process are analyzed. Multiport data analysis techniques and compact modeling are used to study the relationships between the physical and the electrical attributes of the devices. Analytical models, based on measurements from 50 MHz to 20 GHz, are used to explore achievable device performance under different design constraints.
Keywords :
high-frequency transformers; 50 MHz to 20 GHz; Cu; Si; analytical model; copper plating; electrical characteristics; four-port dual-spiral transformer; monolithic RF transformer; multiport data analysis; silicon substrate; Copper; Inductance; Mutual coupling; Performance analysis; Radio frequency; Radiofrequency integrated circuits; Scattering parameters; Silicon; Spirals; Transformers;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1011594
