• DocumentCode
    1829995
  • Title

    DC analysis for power delivery in board design by post-layout simulation

  • Author

    Wui-Weng, Wong

  • Author_Institution
    Adv. Micro Devices (Singapore) Pte. Ltd., Singapore, Singapore
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    802
  • Lastpage
    804
  • Abstract
    Accurate prediction of voltage variation due to IR drop becomes increasingly important in performance driven system board design as supply voltages continue to reduce while current requirements keep on increasing. With advantages of user-friendly and powerful commercial simulation tools nowadays, accurate extraction of power plane resistance is realized even in today system board designed with complex metallization structures due to dense clusters of via holes and cutouts in power and ground planes. As a fundamental electrical requirement in board design, post-layout simulation for DC analysis is proven to be an essential step that benefits the board development productivity and design validation. Board design trade-off and optimization such as copper thickness and number of layers for power planes, static current crowding hot spots prediction and power/ground via population are also discussed in this paper.
  • Keywords
    circuit optimisation; power supply circuits; printed circuit layout; DC analysis; IR drop; board design trade-off; board development productivity; complex metallization structures; copper thickness; dense clusters; design validation; fundamental electrical requirement; ground planes; optimization; performance driven system board design; post-layout simulation; power delivery; power plane resistance; power planes; powerful commercial simulation tools; static current crowding hot spots prediction; supply voltages; user-friendly commercial simulation tools; via holes; voltage variation; Analytical models; Integrated circuits; Layout; Metals; Pins; Proximity effects; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184538
  • Filename
    6184538