DocumentCode
1830195
Title
Scanning force microscopy investigations on electroactive polymer films
Author
Sturm, H. ; Geub, M. ; Schulz, E.
Author_Institution
Fed. Inst. for Mater. Res. & Testing, Berlin, Germany
fYear
1999
fDate
1999
Firstpage
465
Lastpage
468
Abstract
The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields
Keywords
atomic force microscopy; electrets; piezoelectric thin films; polymer films; strain measurement; Au; Au electrodes; PVDF; SFM; applied fields; contactless optical sensor; electrets; electroactive polymer films; polyvinylidenefluoride; scanning force microscopy; strain measurement; Calibration; Capacitive sensors; Electrodes; Gold; Optical fiber sensors; Piezoelectric films; Polymer films; Scanning electron microscopy; Strain measurement; Surface topography;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1999. ISE 10. Proceedings. 10th International Symposium on
Conference_Location
Athens
Print_ISBN
0-7803-5025-1
Type
conf
DOI
10.1109/ISE.1999.832086
Filename
832086
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