DocumentCode :
1830272
Title :
Linearity analysis of CMOS for RF application
Author :
Sanghoon Kang ; Byounggi Choi ; Bumman Kim
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
Volume :
1
fYear :
2002
fDate :
2-7 June 2002
Firstpage :
279
Abstract :
The linearity of CMOS is analyzed. Transconductance and output conductance are two dominant nonlinear sources of CMOS. Capacitances and substrate leakage network do not generate any significant distortions. But they reduce the output impedance for the best linearity and the power gain at a high frequency and the output conductance nonlinearity is significantly at a high frequency. Up to a few GHz, the output conductance is the dominant nonlinear source, and at a higher frequency, the transconductance is the dominant nonlinearity source. OIP3 is reduced by the effects of those components. OIP3s are calculated for various gate length processes. CMOS linearity is dependent only on current density and drain bias voltage but is not dependent on gate length.
Keywords :
CMOS integrated circuits; CMOS circuit; OIP3; RF IC; capacitance; distortion; linearity analysis; nonlinearity; output conductance; output impedance; power gain; substrate leakage; transconductance; CMOS process; CMOS technology; Capacitance; Impedance; Linearity; Radio frequency; Semiconductor device modeling; Taylor series; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7239-5
Type :
conf
DOI :
10.1109/MWSYM.2002.1011611
Filename :
1011611
Link To Document :
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