Title :
Technology development for printed LSIs based on organic semiconductors
Author :
Takeya, J. ; Uno, Masatoshi
Author_Institution :
Grad. Sch. of Frontier Sci., Univ. of Tokyo, Kashiwa, Japan
Abstract :
This presentation focuses on recent development of key technologies for printed LSIs which can provide future low-cost platforms for RFID tags, AD converters, data processors, and sensing circuitries. Such prospect bears increasing reality because of recent research innovations in the field of material chemistry, charge transport physics, and solution processes of printable organic semiconductors. Achieving band transport in state-of-the-art printable organic semiconductors, carrier mobility is elevated above 15 cm2/Vs, so that reasonable speed in moderately integrated logic circuits can be available. With excellent chemical and thermal stability for such compounds, we are developing simple integrated devices based on CMOS using p-type and n-type printed organic FETs. Particularly important are new processing technologies for continuous growth of inch-size organic single-crystalline semiconductor “wafers” from solution and for lithographical patterning of semiconductors and metal electrodes. Successful rectification and identification are demonstrated at 13.56 MHz with printed organic CMOS circuits for the first time.
Keywords :
CMOS integrated circuits; carrier mobility; large scale integration; lithography; logic circuits; organic field effect transistors; organic semiconductors; thermal stability; AD converters; CMOS circuits; RFID tags; carrier mobility; charge transport physics; chemical stability; data processors; frequency 13.56 MHz; integrated devices; lithographical patterning; low-cost platforms; material chemistry; metal electrodes; moderately integrated logic circuits; n-type printed organic FET; organic single-crystalline semiconductor wafers; p-type printed organic FET; printable organic semiconductors; printed LSI; sensing circuitries; solution processes; technology development; thermal stability; CMOS integrated circuits; Crystals; Films; Organic semiconductors; Semiconductor device measurement; Transistors; RFID tag; organic CMOS; organic semiconductor; printed CMOS; printed LSI;
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2014 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4799-3327-3
DOI :
10.1109/VLSIC.2014.6858358