Title :
Introducing Complex Oscillation Based Test: an application example targeting Analog to Digital Converters
Author :
Callegari, Sergio
Author_Institution :
ARCES & DEIS, Univ. of Bologna, Bologna
Abstract :
This paper extends conventional Oscillation Based Test (OBT) methodologies to Complex Oscillation Based Test (COBT) that takes advantage of chaotic dynamics rather than classical oscillation regimes. The underlying concepts of COBT are presented in an operative way, discussing application to Analog to Digital Converters (ADCs). Circuit architectures are illustrated together with mathematical justification and preliminary results.
Keywords :
analogue-digital conversion; circuit oscillations; analog to digital converters; chaotic dynamics; circuit architectures; complex oscillation based test; Analog-digital conversion; Automatic testing; Chaos; Circuit faults; Circuit testing; Fault detection; Feedback loop; Frequency; Hardware; Signal processing;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4541419