• DocumentCode
    1830428
  • Title

    Observation of intensity-dependent excitonic emission linewidth broadening in periodic asymmetric coupled three narrow quantum wells

  • Author

    Ding, Y.J. ; Cui, A.G. ; Lee, S.J. ; Veliadis, J.V.D. ; Khurgin, J.B. ; Li, S. ; Katzer, D.S.

  • Author_Institution
    Dept. of Phys. & Astron., Bowling Green State Univ., OH, USA
  • fYear
    1994
  • fDate
    25-29 Jul 1994
  • Firstpage
    236
  • Lastpage
    238
  • Abstract
    By taking the advantage of an extremely narrow excitonic emission linewidth in a sample of periodic asymmetric coupled three narrow quantum wells, we report our first observation of the broadening of the photoluminescence excitonic linewidth under the low excitation intensities: 0.54 W/cm2-1.6 kW/cm2 at low temperature. The sample was grown by MBE on a semi-insulating GaAs substrate. The expitaxial layers consist of 10 periods, each of which is composed of three narrow asymmetric coupled GaAs quantum wells with the designed thicknesses of45 Å, 30 Å, and 50 Å coupled by 40 Å Al0.3Ga0.7As barriers. We measured photoluminescence excitation spectra in the temperature range of4 K - 300 K
  • Keywords
    III-V semiconductors; aluminium compounds; excitons; gallium arsenide; photoluminescence; semiconductor quantum wells; spectral line breadth; spectral line broadening; 30 A; 4 to 300 K; 40 A; 45 A; 50 A; GaAs-Al0.3Ga0.7As-GaAs; excitonic emission linewidth broadening; expitaxial layers; intensity-dependence; periodic asymmetric coupled three narrow quantum wells; photoluminescence excitation spectra; Absorption; Energy measurement; Excitons; Gallium arsenide; Particle measurements; Photoluminescence; Plasma temperature; Quantum computing; Radiative recombination; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nonlinear Optics: Materials, Fundamentals, and Applications, 1994. NLO '94 IEEE
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    0-7803-1473-5
  • Type

    conf

  • DOI
    10.1109/NLO.1994.470824
  • Filename
    470824