• DocumentCode
    1830755
  • Title

    Formation of electrical contact through an Alodine coating

  • Author

    Wehr, Anna ; Hardee, Harry C. ; Aukland, Neil R. ; Klavens, David

  • Author_Institution
    New Mexico State Univ., Las Cruces, NM, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    14
  • Lastpage
    20
  • Abstract
    In some airplane applications, cadmium plated connectors are mounted to Alodine coated aluminum brackets. Good electrical bonding or grounding is essential through the resistive Alodine coating. The Alodine film is a chromate conversion coating applied to protect aluminum against corrosion. A great deal of variability and increase with time is characteristic for the contact resistance at the interface between the cadmium-plated connector and bracket. Significant rework is sometimes required to stabilize the bond. An understanding of the phenomena responsible for the value of the contact resistance between a cadmium-plated connector and an Alodine coated bracket was the goal of this research work. In this research work, scanning electron microscopy (SEM) and energy-dispersive X-ray analysis (EDX) were used to examine the microstructure of virgin Alodine coatings on unassembled brackets. The next set of SEM and EDX examinations was conducted on Alodine coated brackets that had been assembled and disassembled with a connector
  • Keywords
    X-ray chemical analysis; avionics; contact resistance; corrosion protective coatings; electric connectors; electrical contacts; scanning electron microscopy; Al; Alodine coating; SEM; airplane applications; bracket; chromate conversion coating; contact resistance; corrosion protection; electric connectors; electrical bonding; electrical contact formation; energy-dispersive X-ray analysis; grounding; Airplanes; Aluminum; Bonding; Cadmium; Coatings; Connectors; Contact resistance; Grounding; Protection; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678666
  • Filename
    678666