An ADT comprehensive evaluation method based on Bayesian

Author

Wang, Lizhi ; Jiang, Tongmin ; Li, Xiaoyang ; Zhang, Jingrui

Author_Institution

Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China

fYear

2010

fDate

7-10 Dec. 2010

Firstpage

1761

Lastpage

1765

Abstract

Accelerated degradation testing (ADT) is used to obtain performance parameter in a short time and extrapolate the lifetime and reliability of the products under normal operation conditions. However, sometimes the degradation information from ADT is not enough for the limited cost and time, and the evaluation accuracy of the lifetime and reliability would be low for it. To solve this problem, this paper presents an ADT comprehensive evaluation method based on Bayesian theory, and take super luminescent diode (SLD) as an example to explain the application of this method.

Keywords

Bayes methods; life testing; product life cycle management; superluminescent diodes; Bayesian theory; accelerated degradation testing comprehensive evaluation method; product lifetime; product reliability; super luminescent diode; Bayesian methods; Mechanical products; Monitoring; Reliability; Stress; Superluminescent diodes; Testing; Bayesian; SLD; accelerated degradation testing; comprehensive evaluation; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on

Conference_Location

Macao

ISSN

2157-3611

Print_ISBN

978-1-4244-8501-7

Electronic_ISBN

2157-3611

Type

conf

DOI

10.1109/IEEM.2010.5674568

Filename

5674568