Title :
Study on the method of reliability predication for contacts
Author :
Kui, Li ; Zhigang, Li ; Xiupin, Su ; Guojin, Liu ; Jianguo, Lu
Author_Institution :
Hebei Inst. of Technol., Tianjin, China
Abstract :
This paper has developed a new method of the contact resistance measurement; that of measuring current with a square pulse (pulse width is 300 μS). The range of the pulse current is from 1 A to 100 A. We have used the new method during the test for the contacts in several conditions and found three regularities of contact resistance changing with the pulse current. The new method of contact resistance measurement has the advantage of the reliability predication for the contacts that need not be taken to the laboratory for microanalysis even when the contact resistance is not high and the system failure does not happen
Keywords :
contact resistance; electric resistance measurement; electrical contacts; reliability; 1 to 100 A; 300 mus; contact resistance measurement; microanalysis; pulse current range; reliability predication; square pulse method; Contact resistance; Current measurement; Electrical resistance measurement; Laboratories; Pulse measurements; Space vector pulse width modulation; Surface resistance; Temperature; Testing; Voltage;
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4526-6
DOI :
10.1109/ECTC.1998.678668
