Study on the method of reliability predication for contacts

Author

Kui, Li ; Zhigang, Li ; Xiupin, Su ; Guojin, Liu ; Jianguo, Lu

Author_Institution

Hebei Inst. of Technol., Tianjin, China

fYear

1998

fDate

25-28 May 1998

Firstpage

33

Lastpage

36

Abstract

This paper has developed a new method of the contact resistance measurement; that of measuring current with a square pulse (pulse width is 300 μS). The range of the pulse current is from 1 A to 100 A. We have used the new method during the test for the contacts in several conditions and found three regularities of contact resistance changing with the pulse current. The new method of contact resistance measurement has the advantage of the reliability predication for the contacts that need not be taken to the laboratory for microanalysis even when the contact resistance is not high and the system failure does not happen

Keywords

contact resistance; electric resistance measurement; electrical contacts; reliability; 1 to 100 A; 300 mus; contact resistance measurement; microanalysis; pulse current range; reliability predication; square pulse method; Contact resistance; Current measurement; Electrical resistance measurement; Laboratories; Pulse measurements; Space vector pulse width modulation; Surface resistance; Temperature; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components & Technology Conference, 1998. 48th IEEE

Conference_Location

Seattle, WA

ISSN

0569-5503

Print_ISBN

0-7803-4526-6

Type

conf

DOI

10.1109/ECTC.1998.678668

Filename

678668