• DocumentCode
    1830890
  • Title

    Thermal dissipation analysis in flip chip on board and chip on board assemblies

  • Author

    Baldwin, Daniel F. ; Beerensson, James T.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    76
  • Lastpage
    86
  • Abstract
    Direct chip attach packaging technologies are finding increasing application in electronics manufacturing particularly in telecommunications and consumer electronics. In these systems, bare die with bumped interconnect bond pads are assembled in a flip chip configuration (i.e., active face down) directly to low-cost organic substrates. In the current work, thermal management of three direct chip attach technologies is investigated. Experimental measurements are conducted exploring the junction-to-ambient thermal resistance and thermal dissipation paths for three interconnect technologies including solder attach, anisotropic adhesive attach, and isotropic adhesive attach. A first order chip-scale thermal design model is developed for flip chip assemblies exhibiting good agreement with the experimental measurements
  • Keywords
    adhesion; cooling; flip-chip devices; integrated circuit packaging; soldering; thermal resistance; active face down; anisotropic adhesive attach; bumped interconnect bond pads; chip on board; chip-scale thermal design model; direct chip attach packaging technologies; electronics manufacturing; flip chip on board; isotropic adhesive attach; junction-to-ambient thermal resistance; low-cost organic substrates; solder attach; thermal dissipation analysis; thermal dissipation paths; thermal management; Assembly systems; Bonding; Consumer electronics; Electrical resistance measurement; Electronic packaging thermal management; Flip chip; Manufacturing; Semiconductor device measurement; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678674
  • Filename
    678674