Title :
Thermal dissipation analysis in flip chip on board and chip on board assemblies
Author :
Baldwin, Daniel F. ; Beerensson, James T.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Direct chip attach packaging technologies are finding increasing application in electronics manufacturing particularly in telecommunications and consumer electronics. In these systems, bare die with bumped interconnect bond pads are assembled in a flip chip configuration (i.e., active face down) directly to low-cost organic substrates. In the current work, thermal management of three direct chip attach technologies is investigated. Experimental measurements are conducted exploring the junction-to-ambient thermal resistance and thermal dissipation paths for three interconnect technologies including solder attach, anisotropic adhesive attach, and isotropic adhesive attach. A first order chip-scale thermal design model is developed for flip chip assemblies exhibiting good agreement with the experimental measurements
Keywords :
adhesion; cooling; flip-chip devices; integrated circuit packaging; soldering; thermal resistance; active face down; anisotropic adhesive attach; bumped interconnect bond pads; chip on board; chip-scale thermal design model; direct chip attach packaging technologies; electronics manufacturing; flip chip on board; isotropic adhesive attach; junction-to-ambient thermal resistance; low-cost organic substrates; solder attach; thermal dissipation analysis; thermal dissipation paths; thermal management; Assembly systems; Bonding; Consumer electronics; Electrical resistance measurement; Electronic packaging thermal management; Flip chip; Manufacturing; Semiconductor device measurement; Thermal conductivity; Thermal resistance;
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4526-6
DOI :
10.1109/ECTC.1998.678674