DocumentCode :
1831030
Title :
Robustness of Local Binary Patterns in Brain MR Image Analysis
Author :
Unay, D. ; Ekin, A. ; Cetin, M. ; Jasinschi, R. ; Ercil, A.
Author_Institution :
Video Process. & Anal. Group, Eindhoven
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
2098
Lastpage :
2101
Abstract :
The aging population in developed countries has shifted considerable research attention to diseases related to age. Because age is one of the highest risk factors for neurodegenerative diseases, the need for automated brain image analysis has significantly increased. Magnetic resonance imaging (MRI) is a commonly used modality to image brain. MRI provides high tissue contrast; hence, the existing brain image analysis methods have often preferred the intensity information to others, such as texture. Recently, an easy-to- compute texture descriptor, local binary pattern (LBP), has shown promise in various applications outside the medical field. In this paper, after extensive experiments, we show that rotation-invariant LBP is invariant to some common MRI artifacts that makes it possible to use it in various high-level brain MR image analysis applications.
Keywords :
biomedical MRI; brain; diseases; image texture; medical image processing; neurophysiology; aging population; automated brain image analysis; brain; diseases; local binary patterns; magnetic resonance imaging; neurodegenerative diseases; risk factors; texture descriptor; tissue contrast; Aging; Biomedical imaging; Brain; Diseases; Image analysis; Image motion analysis; Image texture analysis; Magnetic resonance imaging; Medical diagnostic imaging; Robustness; Aging; Algorithms; Artifacts; Brain; Databases, Factual; Humans; Image Processing, Computer-Assisted; Magnetic Resonance Imaging; Models, Statistical; Phantoms, Imaging; Reproducibility of Results; Signal Processing, Computer-Assisted;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4352735
Filename :
4352735
Link To Document :
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