Title :
A 0.8V, 560fJ/bit, 14Gb/s injection-locked receiver with input duty-cycle distortion tolerable edge-rotating 5/4X sub-rate CDR in 65nm CMOS
Author :
Hao Li ; Shuai Chen ; Liqiong Yang ; Rui Bai ; Weiwu Hu ; Zhong, Freeman Y. ; Palermo, Samuel ; Chiang, Patrick Yin
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Abstract :
A quarter-rate forwarded-clock receiver utilizes an edge-rotating 5/4X sub-rate CDR for improved jitter tolerance with low power overhead relative to conventional 2X oversampling CDR systems. Low-voltage operation is achieved with efficient quarter-rate clock generation from an injection-locked oscillator (ILO) and through automatic independent phase rotator control that optimizes timing margin of each input quantizer in the presence of receive-side clock static phase errors and transmitter duty-cycle distortion (DCD). Fabricated in GP 65nm CMOS, the receiver operates up to 16Gb/s with a BER<;10-12, achieves a 1MHz phase tracking bandwidth, tolerates ±50%UIpp DCD on input data, and has 14Gb/s energy efficiency of 560fJ/bit at VDD=0.8V.
Keywords :
CMOS analogue integrated circuits; clock and data recovery circuits; distortion; injection locked oscillators; jitter; receivers; 2X oversampling CDR systems; DCD; GP CMOS; ILO; automatic independent phase rotator control; bandwidth 1 MHz; bit rate 14 Gbit/s; energy efficiency; injection-locked oscillator; injection-locked receiver; input duty-cycle distortion; jitter tolerance; low power overhead; low-voltage operation; quarter-rate clock generation; quarter-rate forwarded-clock receiver; receive-side clock static phase errors; size 65 nm; timing margin; tolerable edge-rotating 5/4X sub-rate CDR; transmitter duty-cycle distortion; voltage 0.8 V; Bandwidth; Bit error rate; CMOS integrated circuits; Clocks; Jitter; Receivers; Shift registers; forwarded-clock receiver; injection-locking;
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2014 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4799-3327-3
DOI :
10.1109/VLSIC.2014.6858399