• DocumentCode
    183136
  • Title

    Application-aware solid-state drives (SSDs) with adaptive coding

  • Author

    Tanakamaru, Shuhei ; Kitamura, Yoshifumi ; Yamazaki, Shumpei ; Tokutomi, Tsukasa ; Takeuchi, Ken

  • Author_Institution
    Chuo Univ., Tokyo, Japan
  • fYear
    2014
  • fDate
    10-13 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Application-aware solid-state drives (SSDs) with 2 adaptive coding schemes to improve reliability are presented. In NAND flash memory, a direct reliability trade-off exists between write/erase (W/E) cycle and data-retention (DR) time. Thus, SSDs can be used for applications that have long DR time and low W/E cycles, or short DR time with high W/E cycles. The n-out-of-8 level cell (nLC) scheme is proposed for low-cost, long-term, archive storage which is indispensable to preserve human digital data. nLC eliminates the memory states of the Triple-Level Cell (TLC) NAND flash memory from 8 to 7...4 levels. Universal asymmetric coding (UAC) is also proposed for cloud/security camera/enterprise storage environments which require high endurance but shorter DR time. Both nLC and UAC optimize coding based on the applications´ required W/E cycle and DR. Bit-error rates (BERs) are improved by 79% and 52% with nLC and UAC, respectively.
  • Keywords
    NAND circuits; adaptive codes; flash memories; integrated circuit reliability; BERs; SSDs; TLC; UAC optimize coding; adaptive coding scheme; application-aware solid-state drives; bit-error rates; cloud-security camera-enterprise storage environments; data-retention time; direct reliability trade-off; human digital data; long DR time; low W-E cycle; low-cost long-term archive storage; memory states; n-out-of-8 level cell scheme; nLC scheme; triple-level cell NAND flash memory; universal asymmetric coding; write-erase cycle; Abstracts; Bit error rate; Ear; Encoding; Reliability engineering; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits Digest of Technical Papers, 2014 Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4799-3327-3
  • Type

    conf

  • DOI
    10.1109/VLSIC.2014.6858406
  • Filename
    6858406