Title :
Dynamic testing of frequency agile transceivers
Author :
Richardson, John ; Flerchinger, Bill ; Higgins, Tom
Author_Institution :
Hewlett-Packard Co., Spokane, WA, USA
Abstract :
New radio transceiver systems pose a measurement challenge to manufacturers and end users alike because many of the system parameters are different from those of previous-generation tactical radios, and test equipment to verify these parameters has not been available. Using dynamic testing of frequency-agile transceivers, the authors identify the important new system parameters, show how these parameters relate to overall system performance, and present commercially available measurement solutions for verifying performance. Measured results of a SINCGARS-like VHF transceiver are presented
Keywords :
automatic test equipment; electronic equipment testing; frequency agility; military equipment; transceivers; SINCGARS-like VHF transceiver; dynamic testing; frequency agile transceivers; radio transceiver; tactical radios; Bit error rate; Frequency synchronization; Jamming; Manufacturing; Spread spectrum communication; System performance; System testing; Test equipment; Transceivers; UHF measurements;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9626