DocumentCode :
1832066
Title :
On the quantification of the state-of-the-art models for skin-effect in conductors, including those with non-rectangular cross-sections
Author :
Curran, Brian ; Ndip, Ivan ; Guttowski, Stephan ; Reichl, Herbert
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
141
Lastpage :
146
Abstract :
Predictability of transmission line parameters in both the frequency and time-domains is very important for microelectronics packaging. Proximity effects and non-rectangular cross-sections can cause a drastic deviation in transmission line parameters from the theoretically calculated values. Filament models and full-wave techniques have offered improvements over analytical models for computing the parameters of transmission lines with arbitrary cross-sections including proximity effects. This work is an analysis of some state-of-the-art skin-effect models and a quantification of their limitations.
Keywords :
conductors (electric); integrated circuit packaging; proximity effect (lithography); skin effect; transmission lines; conductors; filament models; full-wave techniques; microelectronics packaging; nonrectangular cross-sections; proximity effects; skin-effect; state-of-the-art models; transmission line parameters; Conductors; Equations; Frequency; Inductance; Microelectronics; Microstrip; Packaging; Planar transmission lines; Proximity effect; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284564
Filename :
5284564
Link To Document :
بازگشت