• DocumentCode
    1832105
  • Title

    Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications

  • Author

    Shi, S.H. ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    117
  • Lastpage
    124
  • Abstract
    As one of the key requirements of the no-flow underfilling process for flip-chip applications, a proper self-fluxing agent must be incorporated in the developed no-flow underfill materials to provide proper fluxing activity during the simultaneous solder reflow and underfill material curing. However, most fluxing agents have some adverse effects on the no-flow underfill material properties and assembly reliability. In this paper, we have extensively investigated the effect of the concentration of the selected fluxing agent on the material properties, interconnect integrity and assembly reliability. Through this work, an optimum concentration window of the fluxing agent is obtained and a routine procedure of evaluating fluxing agents is established
  • Keywords
    encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; microassembling; reflow soldering; assembly reliability; flip-chip applications; fluxing activity; fluxing agent effects; interconnect integrity; no-flow underfill materials; optimum concentration window; self-fluxing agent; solder reflow; underfill material curing; Assembly; Chemicals; Corrosion; Curing; Epoxy resins; Material properties; Materials reliability; Materials science and technology; Moisture; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678680
  • Filename
    678680