• DocumentCode
    1832132
  • Title

    70% high efficient C-band 27 W hetero-structure FET for space application

  • Author

    Minamide, H. ; Kohno, M. ; Yoshida, N. ; Yajima, K. ; Mori, K. ; Ogata, T. ; Sonoda, T.

  • Author_Institution
    High Frequency & Opt. Semicond. Div., Mitsubishi Electr. Corp., Itami, Japan
  • Volume
    2
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    621
  • Abstract
    A highly reliable and 70% highly efficient C-band 27 W internally-matched GaAs FET with a total gate width of 18.9 mm /spl times/ 4 has been developed for space applications. The newly developed Hetero-structure FET (HFET) successfully reduces the gate leakage current even for RF overdrive region, which is indispensable to improve the power-added efficiency and reliability, simultaneously. The bias conditions and the 2/sup nd/ harmonic tuning for both the input and output matching circuits are also optimized to increase high efficiency. No failure in reliability tests was observed under RF operation based on the European Space Agency Specification (ESA) and RF overdrive at 5dB compression. These excellent results promise that the newly developed HFET can replace the conventional traveling-wave tube amplifiers (TWTAs) for space applications.
  • Keywords
    III-V semiconductors; gallium arsenide; impedance matching; microwave field effect transistors; microwave power transistors; power field effect transistors; semiconductor device reliability; space vehicle electronics; 18.9 mm; 27 W; 4 mm; 70 percent; C-band heterostructure FET; GaAs; bias conditions; gate leakage current; high efficiency HFET; highly reliable GaAs FET; input matching circuits; internally-matched FET; output matching circuits; power-added efficiency; second harmonic tuning; space application; Circuit optimization; Circuit testing; FETs; Gallium arsenide; HEMTs; Impedance matching; Leakage current; MODFETs; Radio frequency; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011698
  • Filename
    1011698