• DocumentCode
    1832190
  • Title

    Susceptibility of IT network systems to interferences by HPEM

  • Author

    Brauer, F. ; Sabath, F. ; Haseborg, J. L Ter

  • Author_Institution
    Inst. of Meas. Technol., Hamburg Univ. of Technol., Hamburg, Germany
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    237
  • Lastpage
    242
  • Abstract
    Intentional electromagnetic interferences (IEMI) have become a threat to various kinds of technical applications. Different high power electromagnetic (HPEM) sources may cause a disruption or destruction of complex electronic systems like communications systems. Even a temporary breakdown of the data transfer is very critical in some applications. In this contribution a COTS IT network system is investigated under HPEM conditions. The susceptibility of the system to interferences by ultra wideband (UWB), damped sinusoid (DS) and high power microwave (HPM) sources is tested and the interference signals on the critical coupling paths are measured. The performance of the system with additional COTS protection devices is also taken into account. The results are to allow first statements about the potential of protecting complex electronic systems against HPEM interferences.
  • Keywords
    electromagnetic interference; information networks; microwave generation; ultra wideband communication; COTS IT network system; COTS protection devices; IT network system susceptibility; communications systems; complex electronic systems; critical coupling paths; damped sinusoid; data transfer; electromagnetic interferences; high power electromagnetic sources; high power microwave sources; interference signals; ultra wideband interferences; Aerospace electronics; Bandwidth; Electric breakdown; Electromagnetic interference; Military aircraft; Power measurement; Power system protection; Pulse measurements; System testing; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284569
  • Filename
    5284569