• DocumentCode
    1832426
  • Title

    Impulsive noise measurement methodologies for APD determination in M2M environments

  • Author

    Chilo, José ; Karlsson, Carl ; Ängskog, Per ; Stenumgaard, Peter

  • Author_Institution
    Center for RF Meas. Technol., Univ. of Gavle, Gavle, Sweden
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    151
  • Lastpage
    154
  • Abstract
    Wireless communications in industrial environments are maintained under persistent adverse conditions, such as noise, fading and many electromagnetic interference sources. These electromagnetic interferences exhibit usually impulsive characteristics and it can seriously degrade the performance of the current wireless systems. Over the last few years, the amplitude probability distribution (APD) had been formally written into CISPR16 as a measure of the emitted electromagnetic energy from electrical equipment. In this approach we present two APD measurement methods. The first method based on 12-bit A/D converter and the second one based on in-phase and quadrature components of the impulsive noise at frequencies between 20 and 3000 MHz. Electromagnetic interference measurements in three different industrial environments were performed using the developed methods with promising results.
  • Keywords
    analogue-digital conversion; electromagnetic interference; impulse noise; radiocommunication; statistical distributions; A-D converter; APD determination; M2M environments; amplitude probability distribution; electromagnetic interference; impulsive noise measurement; wireless communications; Communication industry; Degradation; Electromagnetic interference; Electromagnetic measurements; Energy measurement; Fading; Noise measurement; Probability distribution; Wireless communication; Working environment noise; Amplitude Probability Distribution; Wireless industrial communication systems; impulsive noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284577
  • Filename
    5284577