DocumentCode :
1832431
Title :
Modeling of real-shaped LTCC stripline structure having sharpened edges and embedded pores
Author :
Jae Hyuk Jang ; Ishitobi, N. ; Chul Ho Kim
Author_Institution :
R&D Center, Samsung Electromech., Suwon, South Korea
Volume :
2
fYear :
2002
fDate :
2-7 June 2002
Firstpage :
673
Abstract :
A real-shaped LTCC stripline model including sharpened edges and embedded pores was proposed and simulated using the high frequency simulator software, HFSS. These structural defects occur when LTCC process is used in real fields. The pores made the characteristic impedance of the stripline increase, and /spl alpha/ and /spl beta/ decrease in the range higher than 6% of corresponding initial values. 6% of /spl beta/ could have an important meaning for circuit designers. Sharpened edge made the characteristic impedance and /spl alpha/ increase, while did not affect /spl beta/.
Keywords :
ceramics; porous materials; strip lines; HFSS; characteristic impedance; embedded pores; high-frequency simulator software; real-shaped LTCC stripline model; sharpened edges; structural defects; Ceramics; Circuits; Components, packaging, and manufacturing technology; Composite materials; Conductors; Delamination; Impedance; Packaging; Shape control; Stripline;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7239-5
Type :
conf
DOI :
10.1109/MWSYM.2002.1011710
Filename :
1011710
Link To Document :
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