DocumentCode :
1832997
Title :
High temperature joints manufactured at low temperature
Author :
So, William W. ; Lee, Chin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
284
Lastpage :
291
Abstract :
A fluxless bonding process using either indium-silver or tin-copper multilayer composite to produce high temperature joints at relatively low temperature has been developed. The process temperatures for indium-silver and tin-copper system are 210°C and 280°C, respectively. Joints, which are almost void-free, with melting temperatures of 210°C and 415°C, respectively, are made. After further annealing at 150°C for In-Ag and 280°C for Sn-Cu, the re-melting temperature of the joints increases to above 700°C. The technique, thus, provides a quantum jump to the post-processing temperature of component fabrication. In either process, the joints are examined using a scanning acoustic microscope to confirm the bonding quality. The joint cross-sections are studied using SEM and EDX to find the microstructure and composition. Upon deposition, In interacts with Ag to become In-AgIn2 composite, and Sn interacts with Cu to become Sn-Cu6Sns composite. The intermetallic compounds AgIn 2 and Cu6SnS prevent the In and Sn layers from oxidation in atmosphere. Thus no flux is needed. Besides the fluxless feature, the low process temperature would significantly reduce the stresses developed due to thermal expansion mismatch comparing to the otherwise high temperature processes with temperature exceeding the melting temperature. The multilayer bonding method also facilitates precise control of the alloy composition and the joint thickness. The new technique should find applications in the emergent high temperature electronic devices
Keywords :
X-ray chemical analysis; acoustic microscopy; annealing; copper alloys; indium alloys; joining processes; melting; scanning electron microscopy; silver alloys; thermal expansion; tin alloys; 150 degC; 210 degC; 280 degC; 415 degC; EDX; InAg; SEM; SnCu; annealing; bonding quality; fluxless bonding process; high temperature joints; melting temperatures; multilayer bonding method; process temperatures; re-melting temperature; scanning acoustic microscope; thermal expansion mismatch; Annealing; Bonding processes; Fabrication; Manufacturing; Microstructure; Nonhomogeneous media; Scanning electron microscopy; Temperature; Thermal stresses; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678707
Filename :
678707
Link To Document :
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