• DocumentCode
    1833021
  • Title

    An Automated System for De-Embedded Measurements of Noise and Gain Parameters

  • Author

    Hirsch, V.A. ; Brunsman, M.D. ; Miers, T.H.

  • Author_Institution
    Ball Aerospace Systems Division, Boulder, Colorado
  • Volume
    11
  • fYear
    1987
  • fDate
    31929
  • Firstpage
    38
  • Lastpage
    51
  • Abstract
    This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.
  • Keywords
    Automatic testing; FETs; Fixtures; Gain measurement; Gallium arsenide; Hardware; Measurement techniques; Noise measurement; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 29th
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1987.323854
  • Filename
    4119412
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1833021