• DocumentCode
    1833028
  • Title

    An analytic expression for the HBT extrinsic base-collector capacitance derived from S-parameter measurements

  • Author

    Wasige, E. ; Sheinman, B. ; Sidorov, V. ; Cohen, S. ; Ritter, D.

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    2
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    733
  • Abstract
    Direct extraction is the most accurate method for the determination of equivalent-circuits of heterojunction bipolar transistors (HBTs). However, previous work lacks an exact expression for the extrinsic base-collector capacitance, which models the distributed nature of the base. This paper gives the derivation of an exact expression for this capacitance. As a result, each intrinsic equivalent-circuit parameter is determined using a simple exact expression at each measured frequency. The expression is valid for both the hybrid- /spl pi/ and the physics-based T-topology equivalent circuits. Extraction results for InP- and GaAs-HBTs are given.
  • Keywords
    S-parameters; capacitance; equivalent circuits; heterojunction bipolar transistors; microwave bipolar transistors; GaAs; HBT; InP; S-parameter measurements; extrinsic base-collector capacitance; hybrid-/spl pi/ equivalent circuits; intrinsic equivalent-circuit parameter; physics-based T-topology equivalent circuits; Area measurement; Capacitance measurement; Circuit testing; Design optimization; Electrical resistance measurement; Equivalent circuits; Heterojunction bipolar transistors; Parasitic capacitance; Physics; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011733
  • Filename
    1011733