DocumentCode :
1833028
Title :
An analytic expression for the HBT extrinsic base-collector capacitance derived from S-parameter measurements
Author :
Wasige, E. ; Sheinman, B. ; Sidorov, V. ; Cohen, S. ; Ritter, D.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume :
2
fYear :
2002
fDate :
2-7 June 2002
Firstpage :
733
Abstract :
Direct extraction is the most accurate method for the determination of equivalent-circuits of heterojunction bipolar transistors (HBTs). However, previous work lacks an exact expression for the extrinsic base-collector capacitance, which models the distributed nature of the base. This paper gives the derivation of an exact expression for this capacitance. As a result, each intrinsic equivalent-circuit parameter is determined using a simple exact expression at each measured frequency. The expression is valid for both the hybrid- /spl pi/ and the physics-based T-topology equivalent circuits. Extraction results for InP- and GaAs-HBTs are given.
Keywords :
S-parameters; capacitance; equivalent circuits; heterojunction bipolar transistors; microwave bipolar transistors; GaAs; HBT; InP; S-parameter measurements; extrinsic base-collector capacitance; hybrid-/spl pi/ equivalent circuits; intrinsic equivalent-circuit parameter; physics-based T-topology equivalent circuits; Area measurement; Capacitance measurement; Circuit testing; Design optimization; Electrical resistance measurement; Equivalent circuits; Heterojunction bipolar transistors; Parasitic capacitance; Physics; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7239-5
Type :
conf
DOI :
10.1109/MWSYM.2002.1011733
Filename :
1011733
Link To Document :
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