DocumentCode

1833050

Title

Automated Noise Parameter Measurement Using a New De-Embedding. Algorithm

Author

Schwartz, Robert N.

Author_Institution

Avantek, Inc. 481 Cottonwood Dr. Milpitas, Ca. 95035

Volume

11

fYear

1987

fDate

31929

Firstpage

52

Lastpage

58

Keywords

Acoustic reflection; Automatic testing; Diodes; Impedance; Microwave measurements; Noise figure; Noise measurement; Scattering parameters; Signal to noise ratio; Tuners;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest-Spring, 29th

Conference_Location

Las Vegas, NV, USA

Print_ISBN

0-7803-5686-1

Type

conf

DOI

10.1109/ARFTG.1987.323855

Filename

4119413