• DocumentCode
    1833080
  • Title

    High efficiency detection of tritium using silicon avalanche photodiodes

  • Author

    Shah, K.S. ; Gothoskar, P. ; Farrell, R. ; Gordon, J.

  • Author_Institution
    RMD Inc., Watertown, MA, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    845
  • Abstract
    This paper describes our recent work in developing low noise silicon avalanche photodiodes (APD) for detection of tritium (3 H) β-particles with high efficiency. In view of the very low energy of 3H β-particles (Emax=18 keV), research was carried out to produce APD structures with a very thin entrance window. This involved using low energy boron implantation into the APD front surface, followed by pulsed excimer laser annealing of the implanted face to form a p+ contact. The resulting devices had a surface dead layer of about 0.07 to 0.1 μm and operated with low noise threshold (250-300 eV) for 2×2 mm2 size. The 3H β-particle detection efficiency was measured to be approximately 50%. This is about the twice the detection efficiency achieved with standard APDs
  • Keywords
    avalanche photodiodes; beta-ray detection; ion implantation; laser beam annealing; semiconductor device noise; silicon radiation detectors; β-particle detection efficiency; 0.07 to 0.1 mum; 18 keV; 250 to 300 eV; Si avalanche photodiodes; Si:B; T; low energy B implantation; low noise; noise threshold; p+ contact; pulsed excimer laser annealing; surface dead layer; thin entrance window; tritium detection; Avalanche photodiodes; Boron; Electrodes; Semiconductor device noise; Signal to noise ratio; Silicon; Solid scintillation detectors; Surface emitting lasers; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591469
  • Filename
    591469