DocumentCode :
1833128
Title :
Using Modularity to Improve Microwave Instrumentation
Author :
Roos, Mark
Author_Institution :
EIP Microwave, Inc., San Jose, CA
Volume :
11
fYear :
1987
fDate :
31929
Firstpage :
130
Lastpage :
154
Abstract :
So in summary, what EIP is offering in the modular measurement workstation is a way for design and test engineers to a) very cost-effectively configure a total measurement solution, not individual measurement instruments: b) tailor a measurement solution for a particular application and c) give customers a very good upgrade path to continue to enhance the system to meet emerging needs.
Keywords :
Design engineering; Instruments; Investments; Microprogramming; Microwave devices; Programming; Size measurement; Software measurement; Software testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 29th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1987.323860
Filename :
4119418
Link To Document :
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