DocumentCode
1833490
Title
Death, taxes and failing chips
Author
Visweswariah, Chandu
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2003
fDate
2-6 June 2003
Firstpage
343
Lastpage
347
Abstract
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important aspect of high-performance digital integrated circuit design, and indispensable for first-time-right hardware and cutting-edge performance. This invited paper discusses the methodology, analysis, synthesis and modeling aspects of this problem. These aspects of the problem are compared and contrasted in the ASIC and custom (microprocessor) domains. This paper pays particular attention to statistical timing analysis and enumerates desirable attributes that would render such an analysis capability practical and accurate.
Keywords
application specific integrated circuits; design aids; integrated circuit design; integrated circuit reliability; microprocessor chips; statistical analysis; custom domains; design methodology; failing chips; microprocessor domains; parametric yield prediction; statistical timing analysis; Circuit synthesis; Clocks; Delay; Finance; Hardware; Noise cancellation; Permission; RLC circuits; Timing; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2003. Proceedings
Print_ISBN
1-58113-688-9
Type
conf
DOI
10.1109/DAC.2003.1219021
Filename
1219021
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