• DocumentCode
    1833490
  • Title

    Death, taxes and failing chips

  • Author

    Visweswariah, Chandu

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2003
  • fDate
    2-6 June 2003
  • Firstpage
    343
  • Lastpage
    347
  • Abstract
    In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important aspect of high-performance digital integrated circuit design, and indispensable for first-time-right hardware and cutting-edge performance. This invited paper discusses the methodology, analysis, synthesis and modeling aspects of this problem. These aspects of the problem are compared and contrasted in the ASIC and custom (microprocessor) domains. This paper pays particular attention to statistical timing analysis and enumerates desirable attributes that would render such an analysis capability practical and accurate.
  • Keywords
    application specific integrated circuits; design aids; integrated circuit design; integrated circuit reliability; microprocessor chips; statistical analysis; custom domains; design methodology; failing chips; microprocessor domains; parametric yield prediction; statistical timing analysis; Circuit synthesis; Clocks; Delay; Finance; Hardware; Noise cancellation; Permission; RLC circuits; Timing; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2003. Proceedings
  • Print_ISBN
    1-58113-688-9
  • Type

    conf

  • DOI
    10.1109/DAC.2003.1219021
  • Filename
    1219021