DocumentCode :
1833529
Title :
Low Frequency Extension of TSD Characterization
Author :
Truitt, G.Austin
Author_Institution :
TEXAS INSTRUMENTS
Volume :
12
fYear :
1987
fDate :
Dec. 1987
Firstpage :
13
Lastpage :
25
Keywords :
Bandwidth; Delay; Fixtures; Frequency; Instruments; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Winter, 30th
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1987.323878
Filename :
4119440
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1833529
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