DocumentCode
1833690
Title
Delay and slew metrics using the lognormal distribution
Author
Alpert, C.J. ; Liu, F. ; Kashyap, C. ; Devgan, A.
Author_Institution
IBM Corp., Austin, TX, USA
fYear
2003
fDate
2-6 June 2003
Firstpage
382
Lastpage
385
Abstract
For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Since one cannot often afford to run AWE, constant time solutions are required. This work presents the first complete solution to closed form formulae for both delay and slew. Our metrics are derived from matching circuit moments to the lognormal distribution. From a single table, one can easily implement the metrics for delay and slew for both step and ramp inputs. Experiments validate the effectiveness of the metrics for nets from a real industrial design.
Keywords
delay estimation; integrated circuit interconnections; log normal distribution; interconnect delay; lognormal distribution; physical synthesis; slew metrics; static timing analysis; Algorithm design and analysis; Circuit simulation; Circuit synthesis; Computational modeling; Delay estimation; Integrated circuit interconnections; Linear circuits; Permission; Physics computing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2003. Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
1-58113-688-9
Type
conf
DOI
10.1109/DAC.2003.1219029
Filename
1219029
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