Title :
Automated Control of Down Converter Testing
Author :
Hallford, Benn R.
Author_Institution :
Texas Instruments Incorporated, P.O. Box 655474 MS 404, Dallas, TX 75265
Abstract :
The physical layout of down converter circuit boards must be carefully planned when automated testing procedures are to be used. A 6 GHz microwave communications system down converter that was designed for automated testing will be described. The design objectives for automated testing and the board layouts to meet these requirements are discussed for the RF microstrip board and the surface mount technology (SMT) IF amplifier and control circuit board. The down converter discussion is followed by a review of the considerations that must be given to the automated testing of GaAs MMIC mixers at the wafer level.
Keywords :
Automatic control; Automatic testing; Circuit testing; Communication system control; Microstrip; Microwave communication; Printed circuits; Radio frequency; Surface-mount technology; System testing;
Conference_Titel :
ARFTG Conference Digest-Winter, 30th
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1987.323887
