• DocumentCode
    1833775
  • Title

    The effects of 199 MeV proton radiation damage on CdZnTe photon detectors

  • Author

    Hull, Ethan L. ; Pehl, Richard H. ; Varnell, Larry S.

  • Author_Institution
    Cyclotron Facility, Indiana Univ., Bloomington, IN, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    959
  • Abstract
    Four CdZnTe detectors were irradiated with 199 MeV protons to simulate the damaging radiation in space. The gamma-ray spectra of 241Am and 57Co as well as the detector leakage currents were monitored at room temperature to assess the effects of radiation damage. Surprisingly, after a fluence of a few x108 p/cm2, gamma-ray peak shifts and resolution degradation became visible. After a fluence of 5×109 p/cm2 the degradation was quite dramatic. An analysis of these effects clearly demonstrates that radiation damage causes electron trapping in CdZnTe detectors. No increase in leakage current or electronic noise was observed. Radiation damage effects in CdZnTe and germanium detectors are compared. CdZnTe detectors are ~250 times more sensitive to radiation damage than germanium detectors per unit charge-drift distance
  • Keywords
    II-VI semiconductors; astronomical instruments; cadmium compounds; gamma-ray astronomy; gamma-ray detection; leakage currents; proton effects; semiconductor counters; semiconductor device noise; ternary semiconductors; zinc compounds; 199 MeV; 241Am; 57Co; CdZnTe; CdZnTe photon detectors; charge-drift distance; detector leakage currents; electron trapping; electronic noise; gamma-ray peak shifts; gamma-ray spectra; germanium detectors; proton radiation damage; resolution degradation; Degradation; Gamma ray detection; Gamma ray detectors; Gas detectors; Germanium; Leak detection; Leakage current; Protons; Radiation detectors; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591507
  • Filename
    591507