• DocumentCode
    1833926
  • Title

    A continuous time ΔΣ ADC with clock timing calibration

  • Author

    Tsai, Jen-Che ; Chen, Jhy-Rong ; Hsueh, Kang-Wei ; Chen, Mu-Jung

  • Author_Institution
    MediaTek Inc., Hsin-Chu
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    369
  • Lastpage
    372
  • Abstract
    A 3-order multi-bit continuous-time delta-sigma ADC with clock timing calibration circuit is presented. The clock timing calibration circuit is proposed to ensure the stability of the continuous-time delta-sigma ADC and relax the bandwidth requirement of the adder for excess loop delay compensation. The ADC has been designed and fabricated in a 0.13 um CMOS process. The ADC achieves 75 dB dynamic range and 69 dB peak signal-to-noise ratio (SNR) at 1 MHz signal bandwidth and 64 MHz sampling rate while dissipating 2.2 mW from 1.2 V supply.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; sigma-delta modulation; 3-order multibit continuous-time delta-sigma ADC; CMOS process; clock timing calibration; excess loop delay compensation; frequency 1 MHz; frequency 64 MHz; power 2.2 mW; signal-to-noise ratio; size 0.13 mum; voltage 1.2 V; Adders; Bandwidth; CMOS process; Calibration; Circuit stability; Clocks; Delay; Dynamic range; PSNR; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-1-4244-2604-1
  • Electronic_ISBN
    978-1-4244-2605-8
  • Type

    conf

  • DOI
    10.1109/ASSCC.2008.4708804
  • Filename
    4708804