Title :
Going from Frequency to the Time Domain
Author :
Ashley, J.Robert
Author_Institution :
MICROWAVE TECHNOLOGY DEPARTMENT, SANDERS, A LOCKHEED COMPANY, INC., NASHUA, N.H. 03061
Abstract :
This version of my 1988 May ARFTG presentation gives copies of the slides and some additional comments.
Keywords :
Circuit analysis; Circuit testing; Circuit theory; Computer aided software engineering; Frequency; Laplace equations; Microwave technology; Phase noise; Time domain analysis; Transfer functions;
Conference_Titel :
ARFTG Conference Digest-Spring, 31st
Conference_Location :
New York City, NY, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1988.323897
