• DocumentCode
    1833959
  • Title

    A 6b stochastic flash analog-to-digital converter without calibration or reference ladder

  • Author

    Weaver, Skyler ; Hershberg, Benjamin ; Knierim, Daniel ; Moon, Un-Ku

  • Author_Institution
    Sch. of EELS, Oregon State Univ., Corvallis, OR
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    373
  • Lastpage
    376
  • Abstract
    A 6-bit stochastic flash ADC is presented. By connecting many comparators in parallel, a reference ladder is avoided by allowing random offset to set individual trip points. The ADC transfer function is the cumulative density function of comparator offset. A technique is proposed to improve transfer function linearity by 8.5 dB. A test chip, fabricated in 0.18 mum CMOS, achieves ENOB over 4.9 b up to 18 MS/s with 900 mV supply and comparator offset standard deviation of 140 mV Comparators are digital cells to allow automated synthesis. Total core power consumption when fs = 8 MHz is 631muW.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); flash memories; ADC transfer function; CMOS; ENOB; comparator offset; comparators; cumulative density function; size 0.18 mum; stochastic flash analog-to-digital converter; storage capacity 6 bit; voltage 900 mV; Analog-digital conversion; Ash; Calibration; Circuits; Gaussian distribution; Probability density function; Stochastic processes; Transfer functions; USA Councils; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-1-4244-2604-1
  • Electronic_ISBN
    978-1-4244-2605-8
  • Type

    conf

  • DOI
    10.1109/ASSCC.2008.4708805
  • Filename
    4708805