Title :
A New Approach to Planar Structure Characterization Using Time Domain Techniques
Author :
Fidanboylu, K.M. ; Muthukrishnan, N. ; Riad, S.M. ; Elshabini-Riad, A.
Author_Institution :
Virginia Polytechnic Institute and State University, Electrical Engineering Department, Blacksburg, VA 24061
Abstract :
A new approach for planar transmission line characterization is presented. The approach is based on using time domain techniques for characterizing the coaxial to planar adapter probes used in the measurements. The characterization is achieved by developing an equivalent network model for the probes with the aid of a transient circuit analysis computer program.
Keywords :
Circuit analysis computing; Circuit simulation; Coaxial components; Computational modeling; Computer networks; Geometry; Probes; Scattering parameters; Time measurement; Wideband;
Conference_Titel :
ARFTG Conference Digest-Spring, 31st
Conference_Location :
New York City, NY, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1988.323898
