DocumentCode :
1834038
Title :
A 2-GS/s 6-bit flash ADC with offset calibration
Author :
Lin, Ying-Zu ; Lin, Cheng-Wu ; Chang, Soon-Jyh
Author_Institution :
Nat. Cheng-Kung Univ., Tainan
fYear :
2008
fDate :
3-5 Nov. 2008
Firstpage :
385
Lastpage :
388
Abstract :
A 6-bit flash analog-to-digital converter (ADC) with a digital offset calibration scheme is fabricated in a 0.13-mum CMOS process. Adjusting the programmable loading devices of the preamplifiers enhances the linearity of the proposed ADC. To reduce power consumption, the utilized current-mode flip-flops change their operation mode depending on the sampling rate. A simple detector composed of an inverter and a diode-connected transistor senses the clock rate. This ADC consumes 170 mW from a 1.2-V supply in high-speed mode. The maximum operation speed of this ADC achieves 3.4 GS/s when the input frequency is low. When operating at 2 GS/s, its ENOB is 5.11 bit and ERBW is 650 MHz. The proposed ADC achieves an FOM of 3.79 pJ/conversion-step at 2 GS/s.
Keywords :
CMOS integrated circuits; analogue-digital conversion; flip-flops; invertors; transistor circuits; ADC; CMOS process; current-mode flip-flops; digital offset calibration scheme; diode-connected transistor; flash analog-to-digital converter; frequency 650 MHz; high-speed mode; input frequency; inverter; power 170 mW; power consumption; programmable loading devices; voltage 1.2 V; Analog-digital conversion; CMOS process; Calibration; Detectors; Energy consumption; Flip-flops; Inverters; Linearity; Preamplifiers; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-2604-1
Electronic_ISBN :
978-1-4244-2605-8
Type :
conf
DOI :
10.1109/ASSCC.2008.4708808
Filename :
4708808
Link To Document :
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